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Jatin, J and Monishmurali, M and Shrivastava, M (2023) Multi-finger turn-on: A potential cause of premature failure in Drain Extended HV Nanosheet Devices. In: 61st IEEE International Reliability Physics Symposium, IRPS 2023, 26-30 March 2023, Monterey.
Jatin, J and Monishmurali, M and Gautam, SK and Shrivastava, M (2022) Performance and Reliability Co-Design of HV devices in Vertically Stacked Nanosheet Technology. In: 2022 IEEE International Conference on Emerging Electronics,, 11- 14 Dec 2022, Bangalore.
Gautam, SK and Jatin, J and Monishmurali, M and Shrivastava, M (2022) The Physical Insight into Holding Voltage Engineering of SCR for ESD Protection. In: 2022 IEEE International Conference on Emerging Electronics, 11 - 14 Dec 2022, Bangalore.
