Browse by IISc Authors

Kumar, J and Dar, AB and Shah, AA and Amogh, KM and Chattaraj, S and Patbhaje, U and Rai, AK and Verma, R and Shrivastava, M (2024) Breakthrough Metal/Graphene Interface Phonon Engineering for Reliable Graphene Based-Heat Spreaders. In: 2024 IEEE International Reliability Physics Symposium, IRPS, 14 April 2024through 18 April 2024, Grapevine.

Patbhaje, U and Verma, R and Kumar, J and Dar, AB and Shrivastava, M (2024) Decoupling Current and Voltage Mediated Breakdown Mechanisms in CVD MoS2FETs. In: 2024 IEEE International Reliability Physics Symposium, IRPS, 14 April 2024through 18 April 2024, Grapevine.

Verma, R and Patbhaje, U and Shah, AA and Kumar, J and Chaudhuri, RR and Dar, AB and Shrivastava, M (2024) Hot Carrier Dynamics and Electrical Breakdown Analysis in 2D Transition Metal Dichalcogenide FETs. In: IEEE International Reliability Physics Symposium, IRPS 2024, 14 April 2024 through 18 April 2024, Grapevine.

Rai, AK and Shah, AA and Kumar, J and Chattaraj, S and Dar, AB and Patbhaje, U and Shrivastava, M (2024) MoS2 Field-Effect Transistor Performance Enhancement by Contact Doping and Defect Passivation via Fluorine Ions and Its Cyclic Field-Assisted Activation. In: ACS Nano, 18 (8). pp. 6215-6228.

Kumar, J and Kuruva, H and Variar, HB and Patbhaje, U and Shrivastava, M (2023) Atomic-level Insight and Quantum Chemistry of Ambient Reliability Issues of the TMDs Devices. In: 61st IEEE International Reliability Physics Symposium, IRPS 2023, 26-30 March 2023, Monterey.

Verma, R and Patbhaje, U and Kumar, J and Rai, AK and Shrivastava, M (2023) OFF State Reliability Challenges of Monolayer WS2FET Photodetector: Impact on the Dark and Photo-Illuminated State. In: 61st IEEE International Reliability Physics Symposium, IRPS 2023, 26-30 March 2023, Monterey.

Patbhaje, U and Verma, R and Kumar, J and Ansh, A and Shrivastava, M (2023) Unveiling Field Driven Performance Unreliabilities Governed by Channel Dynamics in MoSe2FETs. In: 61st IEEE International Reliability Physics Symposium, IRPS 2023, 26-30 March 2023, Monterey.

Ansh, A and Patbhaje, U and Kumar, J and Meersha, A and Shrivastava, M (2023) Origin of electrically induced defects in monolayer MoS2 grown by chemical vapor deposition. In: Communications Materials, 4 (1).

Kumar, J and Patbhaje, U and Shrivastava, M (2022) Breathing Mode's Temperature Coefficient Estimation and Interlayer Phonon Scattering Model of Few-Layer Phosphorene. In: ACS Omega, 7 (48). pp. 43462-43467.

Kumar, J and Patbhaje, U and Shrivastava, M (2022) Role of Channel Inversion in Ambient Degradation of Phosphorene FETs. In: IEEE Transactions on Electron Devices, 69 (6). pp. 3353-3358.

Kumar, J and Patbhaje, U and Shrivastava, M (2022) Unveiling Additional Ambient Degradation Issues of Phosphorene FETs Under Laser Exposure and Positive Gate Bias. In: 2022 IEEE International Conference on Emerging Electronics, 11- 14 Dec 2022, Bangalore, India.