Quantum confinement effect on defect level of hydrogen doped rutile VO2nanowires

Dey, M and Chowdhury, S and Kumar, S and Kumar Singh, A (2022) Quantum confinement effect on defect level of hydrogen doped rutile VO2nanowires. In: Journal of Applied Physics, 131 (23).

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Abstract

Accurate description of solubility and defect ionization energies in low dimensional nanostructures is critical for electronic applications of semiconductors with improved functionalities. Here, we present quantum confinement effect driven strategies for tuning defect level of hydrogen doping in the core region of rutile VO 2(R) nanowires. The inverse dependence of a bandgap with a diameter (∝ d - 0.48) confirms the presence of quantum confinement effect in nanowires. The hydrogen doping in both interstitial and substitution at the O site behaves as a deep donor in low diameter nanowires, where the effect of quantum confinement is significant. The position of a donor charge transition level becomes increasingly shallower with increased nanowire diameters. The ionization energies of hydrogen defects decrease for larger-diameter nanowires due to the dielectric screening effect increment. This indicates the possibility of achieving n-type dopability with large diameter VO 2(R) nanowires. This study prescribes the strategies for optimizing doping and the defect level for extensive applications of highly correlated 1D nanostructured materials.

Item Type:	Journal Article
Publication:	Journal of Applied Physics
Publisher:	American Institute of Physics Inc.
Additional Information:	The copyright for this article belongs to the American Institute of Physics Inc.
Keywords:	Hydrogen; Ionization; Oxide minerals; Quantum confinement; Semiconductor doping; Titanium dioxide; Vanadium dioxide, Core region; Deep donor; Defect levels; Electronics applications; Hydrogen doping; Interstitials; Inverse dependence; Large diameter; Low dimensional nanostructures; Quantum confinement effects, Nanowires
Department/Centre:	Division of Chemical Sciences > Materials Research Centre
Date Deposited:	14 Jul 2022 10:15
Last Modified:	14 Jul 2022 10:15
URI:	https://eprints.iisc.ac.in/id/eprint/74418

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