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Conference Paper

Jacob, James and Sivakumar, PS and Agrawal, Vishwani D (1997) Adder and Comparator Synthesis with Exclusive-OR Transform of Inputs. In: Tenth International Conference on VLSI Design, 1997, 4-7 January, Hyderabad,India, 514 -515.

Pramanik, Debashish and Jacob, James and Augustine, Jacob (1997) Lossless compression of images using Minterm coding. In: 1997 International Conference on Information Communications and Signal Processing, ICICS, 9-12 September, Singapore, Vol.3, 1570-1574.

Biswas, NN and Srikanth, C and Jacob, James (1996) Cubical CAMP for Minimization of Boolean Functions. In: 9th International Conference on VLSI Design, 1996, 3-6 January 1996, Bangalore, India, pp. 264-269.

Chaudhary, Anil Kumar and Augustine, Jacob and Jacob, James (1996) Lossless Compression of Images Using Logic Minimization. In: International Conference on Image Processing, 1996, 16-19 September, Lausanne,Switzerland, Vol.1, 77-80.

Majhi, Ananta K and Jacob, James and Patnaik, Lalit M and Agrawal, Vishwani D (1996) On Test Coverage of Path Delay Faults. In: Ninth International Conference on VLSI Design, 1996, 3-6 January, Bangalore,India, 418 -421.

Srinivas, MK and Jacob, James and Agrawal, Vishwani D (1995) Functional Test Generation for Non-Scan Sequential Circuits. In: 8th International Conference on VLSI Design, 1995, 4-7 January 1995, New Delhi, India, pp. 47-52.

Augustine, Jacob and Feng, Wen and Jacob, James (1995) Logic Minimization Based Approach for Compressing Image Data. In: 8th International Conference on VLSI Design, 4-7 January 1995, New Delhi, India, pp. 225-228.

Srinivas, MK and Jacob, James and Agrawal, Vishwani D (1992) Finite State Machine Testing Based on Growth and Disappearance Faults. In: Twenty-Second International Symposium on Fault-Tolerant Computing, 1992. FTCS-22. Digest of Papers, 8-10 July, Boston,MA, 238 -245.

Jain, Kamal Kumar and Jacob, James and Srinivas, MK (1991) ATPG With Efficient Testability Measures and Partial Fault Simulation. In: 1991 Fourth CSI/IEEE International Symposium on VLSI Design, 4-8 January, New Delhi,India, pp. 35-40.

Journal Article

Majhi, Ananta K and Agrawal, Vishwani D and Jacob, James and Patnaik, Lalit M (2000) Line coverage of path delay faults. In: IEEE Transactions on Very Large Scale Integration (VLSI) Systems, 8 (5). pp. 610-614.

Srinivas, MK and Jacob, James and Agrawal, Vishwani D (1996) Functional Test Generation for Synchronous Sequential Circuits. In: IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 15 (7). 831 -843.

Augustine, Jacob and Feng, Wen and Makur, Anamitra and Jacob, James (1995) Switching theoretic approach to image compression. In: Signal Processing, 44 (2). pp. 243-246.

Jacob, James and Biswas, NN (1990) Further comments on "Detection of Faults in Programmable Logic Arrays". In: IEEE Transactions on Computers, 39 (1). pp. 155-157.