Peri, Roja and Venkatramanan, D and Sridevi, K and John, Vinod (2018) Design and Performance Evaluation of a General Purpose Device Characterization Setup. In: 2018 IEEE International Conference on Power Electronics, Drives and Energy Systems (PEDES), 18-21 Dec. 2018, Chennai.
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Abstract
Semiconductor switches of distinct underlying device technologies but with identical ratings are commercially available from a range of manufacturers. Selection of appropriate device for a given power conversion application is critical for meeting the trade-off between cost and performance objectives. This paper discusses the design of a PCB based general purpose discrete device characterization setup using which comparative study of switching and short-circuit behavior of TO-247 devices is performed at room and elevated case temperatures in the range from 120 degrees C to 160 degrees C. The design ensures that the test fixture safely handles the abnormal levels of current stress occurring in the event of a catastrophic device failure. Experimental studies conducted on 1200V, 40A silicon (Si) and 1200V, 50A silicon carbide (SiC) devices from varied manufacturers verify the performance of the characterization setup. The distinctions in their respective switching behavior at nominal and fault conditions, along with the deviations in their characteristics observed at elevated operating temperatures are reported in this work.
| Item Type: | Conference Proceedings |
|---|---|
| Publisher: | IEEE |
| Additional Information: | The copyright for this article belongs IEEE |
| Keywords: | Double Pulse Test; Short circuit test; Device Characterization; Heat Spreader |
| Department/Centre: | Division of Electrical Sciences > Electrical Communication Engineering > Electrical Communication Engineering - Technical Reports |
| Date Deposited: | 20 Jun 2019 16:54 |
| Last Modified: | 21 Jun 2019 19:05 |
| URI: | http://eprints.iisc.ac.in/id/eprint/62991 |
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