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Saxena, PK and Bhat, N (2003) Process technique for SEU reliability improvement of deep sub-micron SRAM cell. In: Solid-State Electronics, 47 (4). pp. 661-664.

Madhavan, Veni CE and Saxena, PK (2003) Recent Trends in Applied Cryptology. In: Institution of Electronics and Telecommunication Engineers technical review, 20 (2). pp. 119-128.