Number of items: 2.
Journal Article
Kranthi, NK and Sarro, JD and Rajagopal, K and Kunz, H and Sankaralingam, R and Boselli, G and Shrivastava, M
(2022)
Unique Rise Time Sensitivity Leading to Air Discharge System-Level ESD Failures in Bidirectional High Voltage SCRs.
In: IEEE Transactions on Electron Devices, 69
(5).
pp. 2552-2559.
Kranthi, NK and Sarro, JD and Sankaralingam, R and Boselli, G and Shrivastava, M
(2021)
System-Level IEC ESD Failures in High-Voltage DeNMOS-SCR: Physical Insights and Design Guidelines.
In: IEEE Transactions on Electron Devices, 68
(9).
pp. 4242-4250.
This list was generated on Thu Jan 30 15:37:59 2025 IST.
