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Conference Paper

Deepak, KG and Reyna, Robinson and Singh, Virendra and Singh, Adit D (2009) Leveraging Partially Enhanced Scan for Improved Observability in Delay Fault Testing. In: 18th Asian Test Symposium, NOV 23-26, 2009, Taichung.

This list was generated on Mon May 23 13:05:34 2022 IST.