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Karunagaran, B and Kumar, Rajendra TR and Kumar, Senthil V and Mangalaraj, D and Narayandass, SK and Rao, Mohan G (2003) Structural characterization of DC magnetron-sputtered TiO2 thin films using XRD and Raman scattering studies. In: Materials Science in Semiconductor Processing, 6 (5-6). pp. 547-550.
