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Journal Article

Sinha, Rajat and Bhattacharya, Prasenjit and Iben, Icko Eric Timothy and Sambandan, Sanjiv and Shrivastava, Mayank (2019) ESD Reliability Study of a-Si:H Thin-Film Transistor Technology: Physical Insights and Technological Implications. In: IEEE TRANSACTIONS ON ELECTRON DEVICES, 66 (6). pp. 2624-2630.

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