Number of items: 2.
Conference Paper
Sindia, Suraj and Singh, Virendra and Agrawal , Vishwani
(2009)
V-Transform: “An Enhanced Polynomial Coefficient Based DC Test for Non-linear Analog Circuits.
In: IEEE East West Design and Test Symposium (EWDTS) 2009, Sep 2009, Moscow, Russia.
Sindia, Suraj and Singh, Virendra and Agrawal, Vishwani
(2009)
Bounds on Defect Level and Fault Coverage in Linear Analog Circuit Testing.
In: 14th IEEE VLSI Design and Test Symposium (VDAT), July 2009, Bangalore.
This list was generated on Sat Dec 7 14:15:27 2024 IST.
