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Bounds on Defect Level and Fault Coverage in Linear Analog Circuit Testing

Sindia, Suraj and Singh, Virendra and Agrawal, Vishwani (2009) Bounds on Defect Level and Fault Coverage in Linear Analog Circuit Testing. In: 14th IEEE VLSI Design and Test Symposium (VDAT), July 2009, Bangalore.

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Transfer function coefficients (TFC) are widely used to test linear analog circuits for parametric and catastrophic faults. This paper presents closed form expressions for an upper bound on the defect level (DL) and a lower bound on fault coverage (FC) achievable in TFC based test method. The computed bounds have been tested and validated on several benchmark circuits. Further, application of these bounds to scalable RC ladder networks reveal a number of interesting characteristics. The approach adopted here is general and can be extended to find bounds of DL and FC of other parametric test methods for linear and non-linear circuits.

Item Type: Conference Paper
Department/Centre: Division of Interdisciplinary Sciences > Supercomputer Education & Research Centre
Date Deposited: 14 Dec 2011 05:21
Last Modified: 14 Dec 2011 05:21
URI: http://eprints.iisc.ac.in/id/eprint/41259

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