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Ahlawat, S and Vaghani, D and Tudu, J and Singh, V (2018) On securing scan design from scan-based side-channel attacks. In: 26th IEEE Asian Test Symposium, ATS 2017, 27 - 30 November 2017, Taipei, pp. 54-59.

This list was generated on Fri Apr 19 08:53:49 2024 IST.