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Number of items: 4.

Shankar, B and Shikha, S and Singh, A and Kumar, J and Soni, A and Dutta Gupta, S and Raghavan, S and Shrivastava, M (2020) Time Dependent Shift in SOA Boundary and Early Breakdown of Epi-Stack in AlGaN/ GaN HEMTs under Fast Cyclic Transient Stress. In: IEEE Transactions on Device and Materials Reliability, 20 (3). pp. 562-569.

Venkatesh, C and Bhat, N (2008) Reliability Analysis of Torsional MEMS Varactor. In: IEEE Transactions on Device and Materials Reliability, 8 (1). pp. 129-134.

Babu, Naseer P and Govind, G and Prasad, SMS and Bhat, KN (2007) Electrical and Reliability Studies of "Wet $N_2O$" Tunnel Oxides Grown on Silicon for Flash Memory Applications. In: IEEE Transactions on Device and Materials Reliability, 7 (3). pp. 420-428.

Saxena, Prashant Kumar and Bhat, Navakanta (2003) SEU Reliability Improvement Due to Source-Side Charge Collection in the Deep-Submicron SRAM Cell. In: IEEE Transactions on Device and Materials Reliability, 3 (1). pp. 14-17.

This list was generated on Mon Jun 17 05:55:26 2024 IST.