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Goyal, M and Chaturvedi, M and Kumar, R and Vaidya, M and Shrivastava, M (2024) Load-line Dependent Current Filament Dynamics in N anoscale SCR Devices. In: IEEE International Reliability Physics Symposium, IRPS 2024, 14 April 2024through 18 April 2024, Grapevine.
Behera, SP and Vaidya, M and Naugarhiya, A (2024) Low Loss Gate Engineered Superjunction Insulated Gate Bipolar Transistor for High Speed Application. In: 37th International Conference on VLSI Design, VLSID 2024, 6 January 2024 through 10 January 2024, Kolkata, West Bengal, pp. 1-5.
Goyal, M and Chaturvedi, M and Kumar, R and Vaidya, M and Shrivastava, M (2024) Missing Trigger Circuit Action and Device Engineering for Conventional Nanoscale SCR. In: IEEE International Reliability Physics Symposium, IRPS 2024, 14 April 2024through 18 April 2024, Grapevine.
Naugarhiya, A and Das, C and Vaidya, M (2023) Insulated Gate Bipolar Transistors with Deep Trench Technology for Low Loss Switching Application. In: 2023 IEEE International Conference on Modelling, Simulation and Intelligent Computing, MoSICom 2023, 7 December 2023 through 9 December 2023, Dubai, pp. 317-321.
