Rajput, N and Iyer, VM (2024) A Multilevel Converter Testbench for High-Frequency Power Magnetics Characterization. In: UNSPECIFIED, pp. 3229-3234.
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Abstract
This paper presents a new multilevel magnetic component tester circuit and testbench to characterize highfrequency magnetics for power electronics applications. The proposed circuit topology is reconfigurable and enables the testing of magnetics under various excitation conditions: triangular flux, trapezoidal flux, the presence of DC bias, and a combination of low-frequency and high-frequency excitations. Furthermore, the proposed topology enables the popular two-winding-based measurement approach to quantify the core losses. A SiCMOSFET-based hardware prototype of the multilevel converter is developed in the laboratory to enable higher operating frequencies. Experimental results from the hardware testbench are provided to validate the multilevel and multifrequency operational capabilities of the magnetic tester circuit. © 2024 IEEE.
Item Type: | Conference Paper |
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Publication: | Conference Proceedings - IEEE Applied Power Electronics Conference and Exposition - APEC |
Publisher: | Institute of Electrical and Electronics Engineers Inc. |
Additional Information: | The copyright for this article belongs to Institute of Electrical and Electronics Engineers Inc. |
Keywords: | Computer hardware; Magnetic cores; Power converters; Power electronics, Core loss; Magnetic characterization; Multilevel converter; Quasi-square wave excitation; Quasi-square waves; Square wave excitation; Test-bench; Trapezoidal flux; Triangular flux, Topology |
Department/Centre: | Division of Electrical Sciences > Electrical Engineering |
Date Deposited: | 01 Jun 2024 06:24 |
Last Modified: | 01 Jun 2024 06:24 |
URI: | https://eprints.iisc.ac.in/id/eprint/85147 |
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