A Machine Learning-Based Method for Tuning the Control Loop of Fully Integrated Voltage Regulators

Govindan, S and Kumar, A and Choi, B and Venkataraman, S and Gope, D (2022) A Machine Learning-Based Method for Tuning the Control Loop of Fully Integrated Voltage Regulators. In: IEEE Transactions on Components, Packaging and Manufacturing Technology, 12 (7). pp. 1204-1213.

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Abstract

Fully integrated voltage regulators (FIVRs) have been introduced in the latest generation of microprocessors to improve the power efficiency and performance of processors. FIVR has a feedback control loop that regulates the output voltage in the presence of load current transients, input voltage noise, and variations or drifts in component parameters. The feedback control loop consists of a type-III op-amp compensator (CPS) with programmable resistance and capacitance (RC) values. The RC values are tuned in pre-Si and post-Si stages to achieve the desired stability and transient response. The practical op-amp CPS is nonideal, and it is difficult to model its behavior using analytical models. Hence, tuning methods based on analytical models such as the k -factor method cannot be used to tune the op-amp CPS. Manual tuning of the op-amp RC values or tuning using traditional optimization methods needs either many simulations in the pre-Si stage or many measurements in the post-Si stage. The output impedance and the droop response of FIVR need to be also considered while tuning the control loop. Thus, the tuning of FIVR control loop remains a challenge with significant time and effort being spent on identifying the optimal RC values. A machine learning method based on Bayesian optimization (BO) is proposed to tune the FIVR control loop and is demonstrated to reduce the number of simulations in the pre-Si stage significantly.

Item Type:	Journal Article
Publication:	IEEE Transactions on Components, Packaging and Manufacturing Technology
Publisher:	Institute of Electrical and Electronics Engineers Inc.
Additional Information:	The copyright for this article belongs to the Institute of Electrical and Electronics Engineers Inc.
Keywords:	Analytical models; Capacitance; Closed loop control systems; Electronics packaging; Feedback control; Learning systems; Machine learning; Operational amplifiers; Transient analysis, Electronic Packaging; Fully integrated; Fully integrated voltage regulator; Impedance; Inductor; Integrated circuit modeling; Integrated voltage; Power distribution network; Power integrity; Regulator; Tuning; Voltage regulator's, Voltage regulators
Department/Centre:	Division of Electrical Sciences > Electrical Communication Engineering > Electrical Communication Engineering - Technical Reports
Date Deposited:	27 Sep 2022 07:36
Last Modified:	27 Sep 2022 07:36
URI:	https://eprints.iisc.ac.in/id/eprint/77209

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