Enhanced piezoelectric properties in europium-doped lead lanthanum zirconate titanate thin films

Antony, AJ and Balaraman, AA and Dutta, S (2024) Enhanced piezoelectric properties in europium-doped lead lanthanum zirconate titanate thin films. In: Thin Solid Films, 790 .

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Abstract

This paper investigates the effect of europium (Eu3+) doping on the crystal structure, dielectric and piezoelectric properties of lead lanthanum zirconate titanate (PLZT) thin film. For the present study, Pb0·92(La1-yEuy)0·08(Zr0·52Ti0·48)O3 (PLEZT) compositions with various Eu concentrations (y = 0.0, 0.3, 0.5 and 0.7) were prepared on Si/SiO2/Ti/Pt substrates by chemical solution deposition technique. The X-ray diffraction and Raman spectroscopy studies revealed the structural distortions in PLZT films with Eu doping. The piezoelectric charge coefficient showed significant enhancement with Eu doping for y = 0.5 composition, with good room temperature frequency stability. This improvement in the piezoelectric characteristics of PLEZT films is the result of stronger intrinsic contributions brought in by bigger c/a ratios and higher extrinsic contributions from non-180° domain wall motions. © 2024 Elsevier B.V.

Item Type:	Journal Article
Publication:	Thin Solid Films
Publisher:	Elsevier B.V.
Additional Information:	The copyright for this article belongs to Elsevier B.V.
Keywords:	Crystal structure; Crystallography; Lanthanum compounds; Lead compounds; Piezoelectricity; Raman spectroscopy; Semiconductor doping; Silicon; Structural properties; X ray diffraction, Crystals structures; Dielectrics property; Eu doping; Europium-doped; Lead lanthanum zirconate titanate; Lead lanthanum zirconate titanate thin film; Piezoelectric property; Structure property; Thin-films; X- ray diffractions, Thin films
Department/Centre:	Division of Mechanical Sciences > Materials Engineering (formerly Metallurgy)
Date Deposited:	01 Mar 2024 06:35
Last Modified:	01 Mar 2024 06:35
URI:	https://eprints.iisc.ac.in/id/eprint/83906

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