Negative temperature co-efficient of resistance behaviour of Cr doped ZnO nanoceramics

Das, BK and Das, T and Das, D and Parashar, K and Parashar, SKS and Kumar, R and Anupama, AV and Sahoo, B (2024) Negative temperature co-efficient of resistance behaviour of Cr doped ZnO nanoceramics. In: Materials Science and Engineering: B, 299 .

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Abstract

Here, High Energy Ball Milling (HEBM) is used to prepare Cr doped ZnO (Zn1-xCrxO, x = 0�0.04) nanoceramics and their electrical behaviour is studied in detail. The X-ray diffraction suggests a hexagonal wurtzite structure. The Rietveld refinement XRD pattern of the sample calcined at 900 °C suggests that up to 4 at of Cr can be doped into the ZnO structure. After sintering, the growth in the particle size was observed for Cr doped ZnO samples. The complex impedance behaviour of samples suggests a decrease in resistance with temperature. This shows the Negative Temperature Coefficient of Resistance (NTCR) characteristic of the Cr doped ZnO sample in the studied temperature range (300�500 °C). At higher temperature, the electrical relaxation behaviour is of the non-Debye type as observed from the relaxation time distribution. The equivalent electrical circuit of ZnO and Cr doped ZnO ceramic samples are a parallel arrangement of bulk capacitance (Cb) and bulk resistance (Rb). © 2023 Elsevier B.V.

Item Type:	Journal Article
Publication:	Materials Science and Engineering: B
Publisher:	Elsevier Ltd
Additional Information:	The copyright for this article belongs to Elsevier Ltd.
Keywords:	Ball milling; II-VI semiconductors; Lasers; Particle size; Rietveld refinement; Sintering; Temperature; Zinc oxide; Zinc sulfide, Cr doped ZnO; Cr-doped; Doped ZnO; Electrical behaviors; FESEM; High-energy ball milling; Nano ceramics; Negative temperature coefficient of resistance behavior; Negative temperature coefficient of resistances; Resistance behaviors, X ray photoelectron spectroscopy
Department/Centre:	Division of Chemical Sciences > Materials Research Centre
Date Deposited:	28 Feb 2024 07:06
Last Modified:	28 Feb 2024 07:06
URI:	https://eprints.iisc.ac.in/id/eprint/83717

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