Jalali, SIA and Kumar, P and Jayaram, V (2020) Microstructural equivalence between bending and uniaxial creep. In: Scripta Materialia, 186 . pp. 99-103.
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Abstract
Recently, bending creep has been shown to facilitate the evaluation of creep properties of materials in high throughput fashion. Here, electron back-scattered diffraction analysis was used to observe steady-state substructures formed under bending and uniaxial creep tests. At a given combination of stress and temperature, the sizes of the steady-state sub-grains formed in both the cantilever and the uniaxial test samples were identical. By establishing the microstructural equivalence between bending and uniaxial creep, this study unequivocally validates bending tests for studying the creep response of materials. © 2020
Item Type: | Journal Article |
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Publication: | Scripta Materialia |
Publisher: | Acta Materialia Inc |
Additional Information: | The copyright for this article is belongs to the Acta Materialia Inc. |
Keywords: | Bending creep; Creep substructure; High throughput characterization; Steady-state creep microstructure |
Department/Centre: | Division of Mechanical Sciences > Materials Engineering (formerly Metallurgy) |
Date Deposited: | 03 Jun 2022 05:38 |
Last Modified: | 11 Dec 2022 05:00 |
URI: | https://eprints.iisc.ac.in/id/eprint/65576 |
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