ePrints@IIScePrints@IISc Home | About | Browse | Latest Additions | Advanced Search | Contact | Help

The effects of crystallography on grain-boundary migration in alumina

Farrer, Jeffrey K and Carter, Barry C and Ravishankar, N (2006) The effects of crystallography on grain-boundary migration in alumina. In: Journal of Materials Science, 41 (3). pp. 661-674.

[img] PDF
Restricted to Registered users only

Download (645kB) | Request a copy


The sintering process of ceramics involves mass transport across grain boundaries resulting in the migration of these boundaries. When there is a liquid at the interface-as in liquid-phase sintering-the mass transport can be enhanced. In this study, electron backscatter diffraction has been used to examine grain-boundary migration of controlled interfaces in alumina. The interfaces were prepared by hot pressing single-crystal and polycrystalline alumina to single-crystal alumina substrates of known orientation. EBSD patterns, taken near the sintered interfaces, have been used to study the effects of crystallography on migration direction and rate.

Item Type: Journal Article
Publication: Journal of Materials Science
Publisher: Springer
Additional Information: Copyright of this article belongs to Springer.
Department/Centre: Division of Chemical Sciences > Materials Research Centre
Date Deposited: 25 Aug 2008
Last Modified: 19 Sep 2010 04:26
URI: http://eprints.iisc.ac.in/id/eprint/6518

Actions (login required)

View Item View Item