Farrer, Jeffrey K and Carter, Barry C and Ravishankar, N (2006) The effects of crystallography on grain-boundary migration in alumina. In: Journal of Materials Science, 41 (3). pp. 661-674.
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Abstract
The sintering process of ceramics involves mass transport across grain boundaries resulting in the migration of these boundaries. When there is a liquid at the interface-as in liquid-phase sintering-the mass transport can be enhanced. In this study, electron backscatter diffraction has been used to examine grain-boundary migration of controlled interfaces in alumina. The interfaces were prepared by hot pressing single-crystal and polycrystalline alumina to single-crystal alumina substrates of known orientation. EBSD patterns, taken near the sintered interfaces, have been used to study the effects of crystallography on migration direction and rate.
Item Type: | Journal Article |
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Publication: | Journal of Materials Science |
Publisher: | Springer |
Additional Information: | Copyright of this article belongs to Springer. |
Department/Centre: | Division of Chemical Sciences > Materials Research Centre |
Date Deposited: | 25 Aug 2008 |
Last Modified: | 19 Sep 2010 04:26 |
URI: | http://eprints.iisc.ac.in/id/eprint/6518 |
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