Daniel, SK and Nair, A and Sambandan, S (2018) Characterization system for large area electronic systems. In: 2018 3rd IEEE International Conference on Recent Trends in Electronics, Information & Communication Technology (RTEICT), 18-19 May 2018, Institute at Sri Venkateshwara College of Engineering (SVCE), Bangalore, India, pp. 1824-1828.
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Abstract
Large area electronic systems use either an active or passive matrix sensory back plane as the major component in the system design. These backplanes are vulnerable to interconnection errors and poor device performances. Hence reliability studies pertaining to the systems of these order are relevant. In this paper we discuss the development of a sensor array characterization system which can not only detect interconnect faults, but also characterize the access switches in the array. Switched capacitor circuits based on n channel MOSFETs and RC networks are used for demonstrating the utility of the system in active addressing and passive addressing schemes respectively. In Switched capacitor circuit based backplane, an approximate transfer characteristics is obtained by measuring the time averaged current through the MOSFET in response to an applied gate voltage, while time constant estimation is done for characterizing the RC networks. © 2018 IEEE.
| Item Type: | Conference Paper |
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| Publication: | 2018 3rd IEEE International Conference on Recent Trends in Electronics, Information and Communication Technology, RTEICT 2018 - Proceedings |
| Publisher: | Institute of Electrical and Electronics Engineers Inc. |
| Additional Information: | cited By 0; Conference of 3rd IEEE International Conference on Recent Trends in Electronics, Information and Communication Technology, RTEICT 2018 ; Conference Date: 18 May 2018 Through 19 May 2018; Conference Code:158096 |
| Keywords: | Switched capacitor networks; Testing, Active matrixes; Addressing scheme; Device performance; Interconnect faults; Large-area electronics; Passive matrix; Switched -capacitor circuits; Transfer characteristics, MOSFET devices |
| Department/Centre: | Division of Physical & Mathematical Sciences > Instrumentation Appiled Physics |
| Date Deposited: | 04 Sep 2020 06:10 |
| Last Modified: | 04 Sep 2020 06:10 |
| URI: | http://eprints.iisc.ac.in/id/eprint/65023 |
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