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Advanced transmission electron microscope triboprobe with automated closed-loop nanopositioning

Lockwood, AJ and Wedekind, J and Gay, RS and Bobji, MS and Amavasai, B and Howarth, M and Moebus, G and Inkson, BJ (2010) Advanced transmission electron microscope triboprobe with automated closed-loop nanopositioning. In: Measurement Science and Technology, 21 (7).

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Official URL: http://iopscience.iop.org/0957-0233/21/7/075901


Here the design and operation of a novel transmission electron microscope (TEM) triboprobe instrument with real-time vision control for advanced in situ electron microscopy is demonstrated. The NanoLAB triboprobe incorporates a new high stiffness coarse slider design for increased stability and positioning performance. This is linked with an advanced software control system which introduces both new and flexible in situ experimental functional testing modes, plus an automated vision control feedback system. This advancement in instrumentation design unlocks new possibilities of performing a range of new dynamical nanoscale materials tests, including novel friction and fatigue experiments inside the electron microscope.

Item Type: Journal Article
Publication: Measurement Science and Technology
Publisher: Institute of Physics
Additional Information: Copyright of this article belongs to Institute of Physics.
Keywords: in situ TEM; triboprobe; closed-loop control; nano-fatigue; nano-friction
Department/Centre: Division of Mechanical Sciences > Mechanical Engineering
Date Deposited: 12 Jul 2010 10:12
Last Modified: 19 Sep 2010 06:10
URI: http://eprints.iisc.ac.in/id/eprint/28966

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