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Journal Article

Kranthi, Nagothu Karmel and Shrivastava, Mayank (2017) ESD Behavior of Tunnel FET Devices. In: IEEE Transactions on Electron Devices, 64 (1). pp. 28-36. ISSN 0018-9383

This list was generated on Sat Jun 22 21:37:50 2024 IST.