Number of items: 2.
Conference Paper
Rajesh, Venkat and Erik, Larsson and Gaur, MS and Singh, Virendra
(2009)
A Odd-Even DFD for scan chain diagnosis.
In: 10th IEEE Workshop on RTL and High Level Test (WRTLT), Nov 2009, Hong Kong.
Subramanyan, Pramod and Jangir, Ram Rakesh and Tudu, Jaynarayan and Erik, Larsson and Singh, Virendra
(2009)
Generation of Minimum Leakage Input Vectors with Constrained NBTI Degradation.
In: IEEE East-West Design and Test Symposium (EWDTS) 2009, Moscow, Russia.
This list was generated on Sat Apr 27 01:43:58 2024 IST.
