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A Odd-Even DFD for scan chain diagnosis

Rajesh, Venkat and Erik, Larsson and Gaur, MS and Singh, Virendra (2009) A Odd-Even DFD for scan chain diagnosis. In: 10th IEEE Workshop on RTL and High Level Test (WRTLT), Nov 2009, Hong Kong.

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Item Type: Conference Paper
Department/Centre: Division of Interdisciplinary Sciences > Supercomputer Education & Research Centre
Date Deposited: 13 Dec 2011 12:02
Last Modified: 13 Dec 2011 12:03
URI: http://eprints.iisc.ac.in/id/eprint/41275

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