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Kumar, J and Ansh, A and Kuruva, H and Shrivastava, M (2020) Defect Assisted Metal-TMDs Interface Engineering: A First Principle Insight. In: Device Research Conference - Conference Digest, DRC, 21-24 June 2020, Columbus; United States.
Mech, RK and Mohta, N and Muralidharan, R and Nath, DN (2019) Ultra-high responsivity and photovoltaic effect based on vertical transport in multi-layer α -InSe. In: 2019 Device Research Conference (DRC), 23-26 June 2019, Ann Arbor, MI, USA, pp. 189-190.
Kulkarni, JP and Bhat, N (2006) Effect of Poly-Si Gate Depletion on Tuning Range in MOS Varactors. In: 64th Device Research Conference, DRC 2006, 26 June 2006through 28 June 2006, Parker, pp. 81-82.