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Kanjilal, A and Kumar, P (2020) Insights into growth behavior of intermetallic compounds in Sn-Ag-Cu solder joints during mechanical and thermo-mechanical deformation processes. In: 2019 IEEE 21st Electronics Packaging Technology Conference, EPTC 2019, 4-6 Dec. 2019, Marina Bay Sands Convention Centre, Singapore, pp. 48-52.
Sonawane, D and Kumar, P (2019) Effect of accelerated thermal cyclic loading on structural reliability of cu-filled TSV. In: 2019 IEEE 21st Electronics Packaging Technology Conference (EPTC), 4-6 Dec. 2019, Singapore, Singapore, pp. 1-5.