Number of items: 2.
Kranthi, N K and Mishra, Abhishek and Meersha, Adil and Variar, Harsha B and Shrivastava, Mayank
(2018)
Defect-Assisted Safe Operating Area Limits and High Current Failure in Graphene FETs.
In: 2018 IEEE International Reliability Physics Symposium (IRPS), 11-15 March 2018, Burlingame.
Sinha, Rajat and Kranthi, N K and Sambandan, Sanjiv and Shrivastava, Mayank
(2017)
On the ESD Behavior of Pentacene Channel Organic Thin Film Transistors.
In: 39th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD), SEP 10-14, 2017, Tucson, AZ.
This list was generated on Sun Dec 22 06:36:47 2024 IST.
