Deep Unfolding-Based Channel Estimation and Soft Symbol Decoding with Low-Resolution ADCs

Katyal, S and Sameera Bharadwaja, H and Murthy, CR (2024) Deep Unfolding-Based Channel Estimation and Soft Symbol Decoding with Low-Resolution ADCs. In: 32nd European Signal Processing Conference, EUSIPCO 2024, 26 August 2024through 30 August 2024, Lyon, pp. 862-866.

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Abstract

This work develops a deep unfolding-based variational Bayes (VB) technique called learned-VB for joint channel estimation and data decoding using quantized inputs in a massive multi-input multi-output (MIMO) uplink system. The unfolded neural network learns the channel statistics using self-training. The training process does not explicitly optimize to reduce the difference between the actual and estimated channel statistics. Instead, a linear combination of cross-entropy loss between the true and the soft data symbols and the mean squared error loss between the true and the estimated channel is minimized. The performance of the proposed algorithm is studied and compared against a channel statistics-aware VB algorithm under both i.i.d. and correlated channel models. It is found that the deep unfolding model overcomes the dependency on the knowledge of the channel statistics, thus making the approach suitable for unknown or mismatched channel statistics. Specifically, the unfolding-based method performs on par with the vanilla VB inference (VBI) algorithm when the latter has exact knowledge of the channel statistics while offering much better performance when the channel statistics are mismatched. © 2024 European Signal Processing Conference, EUSIPCO. All rights reserved.

Item Type:	Conference Paper
Publication:	European Signal Processing Conference
Publisher:	European Signal Processing Conference, EUSIPCO
Additional Information:	The copyright for this article belongs to publisher.
Keywords:	Channel coding; Channel estimation; Decoding; Deep neural networks; Error statistics; Forward error correction; Image coding; Image segmentation, Analog to digital converters; Analog-to-digital converter; Channel statistics; Data decoding; Deep unfolding; Low resolution ADC; Neural-networks; Soft symbol decoding; Unfoldings; Variational bayes, Mean square error
Department/Centre:	Division of Electrical Sciences > Electrical Engineering
Date Deposited:	26 Nov 2024 11:57
Last Modified:	26 Nov 2024 11:57
URI:	http://eprints.iisc.ac.in/id/eprint/86907

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