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Electron energy loss spectroscopic investigation of Mie resonances in bimetallic nanostructures

Saha, SK and Mondal, P and Channagiri, SA and Mahadevu, R and Vasudeva, N and Bellare, P and Ravishankar, N and Pandey, A (2024) Electron energy loss spectroscopic investigation of Mie resonances in bimetallic nanostructures. In: Chemical Physics Impact, 9 .

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Official URL: https://doi.org/10.1016/j.chphi.2024.100677

Abstract

Bimetallic nanostructures can exhibit significant broadening of Mie resonances compared to monometallic nanoparticles. Here, we study these materials using Electron Energy Loss Spectroscopy at a single particle level. This technique is immensely effective to probe direct structure-property correlation of nanoparticles. We are thus able to confirm the broadening of Mie resonances at a single particle level. This effect is analyzed in the context of emergence of a new dielectric constant that originates from metallic interfaces. We employ Coronado-Schatz corrections to the usual dielectric constants of the constituent metals to quantitatively simulate these materials. The resultant materials thus exhibit optical cross-sections that are 38.5 and 4.2 of the gold and silver nanoparticle optical cross-section at 2.5 eV and 3.45 eV, respectively. A strong agreement between theory and experiment is observed. We also confirmed the effectiveness of our approach for nanoparticles with different morphologies as well as different compositional ratios. Our study suggests an effective strategy to regulate the dielectric properties of bimetallic nanostructures through interface engineering. © 2024

Item Type: Journal Article
Publication: Chemical Physics Impact
Publisher: Elsevier B.V.
Additional Information: The copyright for this article belongs to Elsevier B.V.
Department/Centre: Division of Chemical Sciences > Materials Research Centre
Division of Chemical Sciences > Solid State & Structural Chemistry Unit
Others
Date Deposited: 16 Dec 2024 10:27
Last Modified: 16 Dec 2024 10:27
URI: http://eprints.iisc.ac.in/id/eprint/85790

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