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Frequency Response Study for a Ramped Field Induced Mass Transport Phenomenon

Ghosh, SN and De Sarkar, D and Sashtri, V and Abraham, E and Talukder, S (2020) Frequency Response Study for a Ramped Field Induced Mass Transport Phenomenon. In: Proceedings of the International Symposium on the Physical and Failure Analysis of Integrated Circuits, 20-23 July, 2020, Singapore.

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Official URL: https://dx.doi.org/10.1109/IPFA49335.2020.9261017

Abstract

Electric field induced mass transport, known as electromigration, can be used to create micro- or nano- scale patterns on a solid surface 1. This paper reports the liquid phase mass transfer phenomenon observed on metallic thin films of Chromium under the influence of ramp-type alternating electric current of high densities. On application of a strong electric field, the layers of the metal seem to react and convert into a liquid compound in presence of air, which flows out radially from the electrodes in a near circular manner. For this study, waveform pattern of the alternating potential was chosen to be ramp waves. On application of alternating potential of various frequencies, ranging from 100 Hz to 700 Hz in steps of 50 Hz, the distance of flow was measured against time, as well as the maximum radius of the flow, before it ceased flowing, as a function of frequency was studied. Also, an attempt was made to put forward the possible reasons which could explain the observations made. This study will help in understanding flow properties leading to greater control over the nanolithography process. © 2020 IEEE.

Item Type: Conference Paper
Publication: Proceedings of the International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA
Publisher: Institute of Electrical and Electronics Engineers Inc.
Additional Information: cited By 0; Conference of 2020 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA 2020 ; Conference Date: 20 July 2020 Through 23 July 2020; Conference Code:165470
Keywords: Electric fields; Failure analysis; Frequency response; Integrated circuits; Mass transfer; Nanotechnology, Electric field induced; Function of frequency; Liquid-phase mass transfer; Metallic thin films; Nano-scale patterns; Strong electric fields; Transport phenomena; Waveform patterns, Failure (mechanical)
Department/Centre: Division of Interdisciplinary Sciences > Centre for Nano Science and Engineering
Date Deposited: 15 Jan 2021 05:56
Last Modified: 15 Jan 2021 05:56
URI: http://eprints.iisc.ac.in/id/eprint/67625

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