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Studies on High Voltage Composite Insulators under very low Temperature

Sharma, Dinesh and Reddy, Subba B (2019) Studies on High Voltage Composite Insulators under very low Temperature. In: IEEE International Conference on High Voltage Engineering and Application, ICHVE 2018, 10 - 13 September 2018, Athens; Greece.

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Official URL: http://dx.doi.org/10.1109/ICHVE.2018.8641896

Abstract

With the advancement in material engineering new insulation materials have been developed with enhanced insulating properties and these materials have certain advantages over glass and porcelain insulators in terms of field performance. Since last decade there is an increase in demand of installing polymer/composite insulator as a preferable choice. These have promising features for high voltage transmission and distribution applications. However, long-term environmental and electric stresses could cause surface degradation and in due course reduce the insulation strength of insulators. In the present work, an attempt is made to study the effect of multiple stresses (humidity, low temperature, UV and electric stress) on the composite insulators. The experimental chamber of 2.5 x 2.5 x 2.5 ft is suitably fabricated for the experiment. The leakage current is regularly monitored over the experimental duration of 1000 hours. The surface morphological studies using Fourier transform infrared (FTIR) spectroscopy, Scanning Electron Microscopy (SEM), Energy Dispersive X-Ray Analysis (EDAX), Wettability Class (WC) measurements and performance of tensile strength of the samples are conducted on the samples before and after experimentation.

Item Type: Conference Proceedings
Series.: International Conference on High Voltage Engineering and Application
Publisher: Institute of Electrical and Electronics Engineers Inc.
Additional Information: Copyright belongs to Institute of Electrical and Electronics Engineers Inc.
Keywords: Electric insulation;Energy dispersive X ray analysis;Fourier transform infrared spectroscopy; Insulating materials; Scanning electron microscopy;Tensile strength; X ray diffraction analysis
Department/Centre: Division of Electrical Sciences > Electrical Engineering
Date Deposited: 16 Apr 2019 06:06
Last Modified: 16 Apr 2019 06:06
URI: http://eprints.iisc.ac.in/id/eprint/62305

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