Effect of Surface Roughness on Bandwidth of a High Frequency Multiple Beam Klystron

Bansiwal, Ashok and Raina, Sushi and Datta, SK and Vinoy, KJ (2018) Effect of Surface Roughness on Bandwidth of a High Frequency Multiple Beam Klystron. In: 3rd International Conference on Microwave and Photonics (ICMAP), FEB 09-11, 2018, Dhanbad, INDIA.

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Abstract

Effect of surface roughness on the bandwidth of a high frequency multiple beam klystron (MBK) cavity circuit is investigated. Surface roughness reduces the surface conductivity of the base material which in turn reduces the unloaded quality factor of the cavity and increases the bandwidth of the cavity. First, effective conductivity is calculated analytically for a given surface roughness, and then it is related to the quality factor and 3dB bandwidth of the cavity. Analytical results are compared with those obtained from 3D simulations.

Item Type:	Conference Proceedings
Publisher:	IEEE, 345 E 47TH ST, NEW YORK, NY 10017 USA
Additional Information:	Copyright of this article belong to IEEE, 345 E 47TH ST, NEW YORK, NY 10017 USA
Department/Centre:	Division of Electrical Sciences > Electrical Communication Engineering
Date Deposited:	17 Jul 2018 15:55
Last Modified:	05 Mar 2019 07:03
URI:	http://eprints.iisc.ac.in/id/eprint/60212

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