Detection of quantum well induced single degenerate-transition-dipoles in ZnO nanorods

Ghosh, Siddharth and Ghosh, Moumita and Seibt, Michael and Rao, G Mohan (2016) Detection of quantum well induced single degenerate-transition-dipoles in ZnO nanorods. In: NANOSCALE, 8 (5). pp. 2632-2638.

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Abstract

Quantifying and characterising atomic defects in nanocrystals is difficult and low-throughput using the existing methods such as high resolution transmission electron microscopy (HRTEM). In this article, using a defocused wide-field optical imaging technique, we demonstrate that a single ultrahigh-piezoelectric ZnO nanorod contains a single defect site. We model the observed dipole-emission patterns from optical imaging with a multi-dimensional dipole and find that the experimentally observed dipole pattern and model-calculated patterns are in excellent agreement. This agreement suggests the presence of vertically oriented degenerate-transition-dipoles in vertically aligned ZnO nanorods. The HRTEM of the ZnO nanorod shows the presence of a stacking fault, which generates a localised quantum well induced degenerate-transition-dipole. Finally, we elucidate that defocused wide-field imaging can be widely used to characterise defects in nanomaterials to answer many difficult questions concerning the performance of low-dimensional devices, such as in energy harvesting, advanced metal-oxide-semiconductor storage, and nanoelectromechanical and nanophotonic devices.

Item Type:	Journal Article
Publication:	NANOSCALE
Publisher:	10.1039/c5nr06722g
Additional Information:	Copy right for this article belongs to the ROYAL SOC CHEMISTRY, THOMAS GRAHAM HOUSE, SCIENCE PARK, MILTON RD, CAMBRIDGE CB4 0WF, CAMBS, ENGLAND
Department/Centre:	Division of Interdisciplinary Sciences > Centre for Nano Science and Engineering
Date Deposited:	12 Jan 2018 10:12
Last Modified:	12 Jan 2018 10:12
URI:	http://eprints.iisc.ac.in/id/eprint/58629

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