ePrints@IIScePrints@IISc Home | About | Browse | Latest Additions | Advanced Search | Contact | Help

Simultaneous Semi-Coupled Dictionary Learning for Matching RGBD data

Das, Nilotpal and Mandal, Devraj and Biswas, Soma (2016) Simultaneous Semi-Coupled Dictionary Learning for Matching RGBD data. In: 29th IEEE Conference on Computer Vision and Pattern Recognition Workshops (CVPRW), JUN 26-JUL 01, 2016, Las Vegas, NV, pp. 243-251.

[img] PDF
Pro_29th_IEEE_Con_Com_Vis_Pat_Rec_Wor_243_2016.pdf - Published Version
Restricted to Registered users only

Download (455kB) | Request a copy
Official URL: http://dx.doi.org/10.1109/CVPRW.2016.37

Abstract

Matching with hidden information which is available only during training and not during testing has recently become an important research problem. Matching data from two different modalities, known as cross-modal matching is another challenging problem due to the large variations in the data coming from different modalities. Often, these are treated as two independent problems. But for applications like matching RGBD data, when only one modality is available during testing, it can reduce to either of the two problems. In this work, we propose a framework which can handle both these scenarios seamlessly with applications to matching RGBD data of Lambertian objects. The proposed approach jointly uses the RGB and depth data to learn an illumination invariant canonical version of the objects. Dictionaries are learnt for the RGB, depth and the canonical data, such that the transformed sparse coefficients of the RGB and the depth data is equal to that of the canonical data. Given RGB or depth data, their sparse coefficients corresponding to their canonical version is computed which can be directly used for matching using a Mahalanobis metric. Extensive experiments on three datasets, EURECOM, VAP RGB-D-T and Texas 3D Face Recognition database show the effectiveness of the proposed framework.

Item Type: Conference Proceedings
Series.: IEEE Computer Society Conference on Computer Vision and Pattern Recognition Workshops
Additional Information: Copy right for this article belongs to the IEEE, 345 E 47TH ST, NEW YORK, NY 10017 USA
Department/Centre: Division of Electrical Sciences > Electrical Communication Engineering
Division of Electrical Sciences > Electrical Engineering
Date Deposited: 18 Feb 2017 04:45
Last Modified: 18 Feb 2017 04:45
URI: http://eprints.iisc.ac.in/id/eprint/56273

Actions (login required)

View Item View Item