Exchange bias in strained SrRuO3 thin films

Sow, Chanchal and Pramanik, AK and Kumar, Anil PS (2014) Exchange bias in strained SrRuO3 thin films. In: JOURNAL OF APPLIED PHYSICS, 116 (19).

PDF jou_app_phy_116-19_2014.pdf - Published Version Restricted to Registered users only Download (2MB) | Request a copy

Abstract

Recently, it was found that the ferromagnetic SrRuO3 when combined with another ferromagnet in thin film form gives rise to exchange bias (EB) effect. However, we observed EB in single, strained, SrRuO3 thin films grown on diamagnetic LaAlO3 (100) substrates. It displays the training effect, which essentially confirms EB. The temperature dependence of the EB reveals the blocking temperature to be around similar to 75 K. The strength of the exchange bias decreases with the increase in thickness of the film. We observe tensile strain in the out of plane direction. Further, the presence of in-plane compressive strain is observed through asymmetric reciprocal space mapping. Finally, we find a direct link between strain and EB. The evolution of strain with thickness matches well with the nature of scaled EB. It has been shown earlier by first principle calculations that this strain can induce EB in thin films. (C) 2014 AIP Publishing LLC.

Item Type:	Journal Article
Publication:	JOURNAL OF APPLIED PHYSICS
Publisher:	AMER INST PHYSICS
Additional Information:	Copyright for this article belongs to the AMER INST PHYSICS, CIRCULATION & FULFILLMENT DIV, 2 HUNTINGTON QUADRANGLE, STE 1 N O 1, MELVILLE, NY 11747-4501 USA
Department/Centre:	Division of Physical & Mathematical Sciences > Physics
Date Deposited:	12 Jan 2015 05:15
Last Modified:	12 Jan 2015 05:15
URI:	http://eprints.iisc.ac.in/id/eprint/50575

Actions (login required)

View Item