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Structural, electrical, and optical properties of as-grown and heat treated ultra-thin SnS films

Devika, M and Reddy, Koteeswara N and Gunasekhar, KR (2011) Structural, electrical, and optical properties of as-grown and heat treated ultra-thin SnS films. In: Thin Solid Films, 520 (1). pp. 628-632.

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Official URL: http://dx.doi.org/10.1016/j.tsf.2011.07.074

Abstract

The composition, structural, electrical, and optical properties of as-grown and heat treated tin-mono-sulfide (SnS) ultra-thin films have been studied. The ultra-thin SnS films were prepared on glass substrates by thermal resistive evaporation technique. All the SnS films contained nanocrystallites and exhibited p-type conductivity with a low Hall-mobility, <50 cm(2)/Vs. All these films are highly tin rich in nature and exhibited orthorhombic crystal structure. As compared to other films, the SnS films annealed at 300 degrees C showed a low electrical resistivity of similar to 36 Omega cm with an optical band gap of similar to 1.98 eV. The observed electrical and optical properties of all the films are discussed based on their composition and structural parameters. These nanocrystalline ultra-thin SnS films could be expected as a buffer layer for the development of tandem solar cell devices due to their low-resistivity and high absorbability with an optimum band gap. (C) 2011 Elsevier B.V. All rights reserved.

Item Type: Journal Article
Publication: Thin Solid Films
Publisher: Elsevier Science
Additional Information: Copyright of this article belongs to Elsevier Science.
Keywords: IV-VI compounds;Tin sulfide;Nanocrystalline films;Ultra-thin films;Surface morphology;Electrical properties;Optical properties
Department/Centre: Division of Physical & Mathematical Sciences > Instrumentation Appiled Physics
Date Deposited: 30 Jan 2012 09:04
Last Modified: 30 Jan 2012 09:04
URI: http://eprints.iisc.ac.in/id/eprint/43172

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