Kumar, Mahesh and Rajpalke, Mohana K and Bhat, Thirumaleshwara N and Roul, Basanta and Kalghatgi, AT and Krupanidhi, SB (2011) Size dependent bandgap of molecular beam epitaxy grown InN quantum dots measured by scanning tunneling spectroscopy. In: Journal of Applied Physics, 110 (11). 114317 -114317.
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Abstract
InN quantum dots (QDs) were grown on Si (111) by epitaxial Stranski-Krastanow growth mode using plasma-assisted molecular beam epitaxy. Single-crystalline wurtzite structure of InN QDs was verified by the x-ray diffraction and transmission electron microscopy. Scanning tunneling microscopy has been used to probe the structural aspects of QDs. A surface bandgap of InN QDs was estimated from scanning tunneling spectroscopy (STS) I-V curves and found that it is strongly dependent on the size of QDs. The observed size-dependent STS bandgap energy shifts with diameter and height were theoretical explained based on an effective mass approximation with finite-depth square-well potential model.
Item Type: | Journal Article |
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Publication: | Journal of Applied Physics |
Publisher: | American Institute of Physics |
Additional Information: | Copyright of this article belongs to American Institute of Physics. |
Department/Centre: | Division of Chemical Sciences > Materials Research Centre |
Date Deposited: | 03 Jan 2012 08:57 |
Last Modified: | 03 Jan 2012 08:57 |
URI: | http://eprints.iisc.ac.in/id/eprint/43007 |
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