Rajesh, Venkat and Erik, Larsson and Gaur, MS and Singh, Virendra (2009) A Odd-Even DFD for scan chain diagnosis. In: 10th IEEE Workshop on RTL and High Level Test (WRTLT), Nov 2009, Hong Kong.
Full text not available from this repository. (Request a copy)| Item Type: | Conference Paper |
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| Department/Centre: | Division of Interdisciplinary Sciences > Supercomputer Education & Research Centre |
| Date Deposited: | 13 Dec 2011 12:02 |
| Last Modified: | 13 Dec 2011 12:03 |
| URI: | http://eprints.iisc.ac.in/id/eprint/41275 |
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