V-Transform: “An Enhanced Polynomial Coefficient Based DC Test for Non-linear Analog Circuits

Sindia, Suraj and Singh, Virendra and Agrawal , Vishwani (2009) V-Transform: “An Enhanced Polynomial Coefficient Based DC Test for Non-linear Analog Circuits. In: IEEE East West Design and Test Symposium (EWDTS) 2009, Sep 2009, Moscow, Russia.

PDF V-Transform.pdf - Published Version Restricted to Registered users only Download (92kB) | Request a copy

Abstract

Abstract—DC testing of parametric faults in non-linear analog circuits based on a new transformation, entitled, V-Transform acting on polynomial coefficient expansion of the circuit function is presented. V-Transform serves the dual purpose of monotonizing polynomial coefficients of circuit function expansion and increasing the sensitivity of these coefficients to circuit parameters. The sensitivity of V-Transform Coefficients (VTC) to circuit parameters is up to 3x-5x more than sensitivity of polynomial coefficients. As a case study, we consider a benchmark elliptic filter to validate our method. The technique is shown to uncover hitherto untestable parametric faults whose sizes are smaller than 10 % of the nominal values. I.

Item Type:	Conference Paper
Department/Centre:	Division of Interdisciplinary Sciences > Supercomputer Education & Research Centre
Date Deposited:	14 Dec 2011 05:09
Last Modified:	14 Dec 2011 05:16
URI:	http://eprints.iisc.ac.in/id/eprint/41270

Actions (login required)

View Item