Rahman, Mohammad Mahbubur and Rukmani, K and Asokan, S (2011) Electrical switching studies on Ge-Te-Tl chalcogenide glasses: Effect of thallium on the composition dependence of switching voltages. In: Journal of Non-Crystalline Solids, 357 (3). pp. 946-950.
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Abstract
Bulk Ge(17)Te83_,JI glasses (05x.5_13), have been found to exhibit memory type electrical switching. The switching voltages (also known as threshold voltage V-th) of Ge17Te83-xTlx glasses are found to decrease with increasing thallium content. The rate of decrease of Vtry is greater at lower concentrations and \textbackslashid, falls at a slower rate for higher thallium concentrations (x 6). The addition of thallium to the Ge-Te network fragments the covalent network and introduces ionic nature to it; the reduction in network connectivity leads to the decrease in switching voltages with thallium content. The decrease in the glass transition temperatures of Ge17Te83-xTlx glasses with increasing thallium concentration supports the idea of decrease in network connectivity with TI addition. The more metallic nature of TI also contributes to the observed reduction in the switching voltages of Ge17Te83-xTlx glasses with TI content. Further, there is an interesting correlation seen between the threshold voltage V-th and the average bond energy, as a function of TI content. In addition, the switching voltages of Ge17Te83-xTlx glasses have been found to decrease with sample thickness almost linearly. The set-reset studies indicate that the Ge17Te83-xTl2 sample can be switched for more than 10 cycles, whereas other glasses could not be reset beyond two switching cycles. (C) 2010 Elsevier B.V. All rights reserved.
Item Type: | Journal Article |
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Publication: | Journal of Non-Crystalline Solids |
Publisher: | Elsevier Science B.V. |
Additional Information: | Copyright of this article belongs to Elsevier Science B.V. |
Keywords: | Chalcogenides;Thallium doping;Electrical switching |
Department/Centre: | Division of Physical & Mathematical Sciences > Instrumentation Appiled Physics |
Date Deposited: | 08 Apr 2011 07:13 |
Last Modified: | 08 Apr 2011 07:13 |
URI: | http://eprints.iisc.ac.in/id/eprint/36571 |
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