Murthy, CN and Ramagopal, Sharma and Asokan, S (2006) A simple low-cost electrical switching analyzer for I-V characterization of switching samples and devices. In: IEEE Transactions on Instrumentation And Measurement, 55 (1, Sp.). pp. 248-256.
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Abstract
The phenomena of nonlinear I-V behavior and electrical switching find extensive applications in power control, information storage, oscillators, etc. The study of I-V characteristics and switching parameters is necessary for the proper application of switching materials and devices. In the present work, a simple low-cost electrical switching analyzer has been developed for the measurement of the electrical characteristics of switching materials and devices. The system developed consists of a microcontroller-based excitation source and a high-speed data acquisition system. The design details of the excitation source, its interface with the high-speed data acquisition system and personal computer, and the details of the application software developed for automated measurements are described. Typical I-V characteristics and switching curves obtained with the system developed are also presented to illustrate the capability of the instrument developed.
Item Type: | Journal Article |
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Publication: | IEEE Transactions on Instrumentation And Measurement |
Publisher: | Institute of Electrical and Electronics Engineers |
Additional Information: | Copyright 2006 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE. |
Keywords: | I-V characteristics; current-controlled negative resistance; electrical switching analyzer. |
Department/Centre: | Division of Physical & Mathematical Sciences > Instrumentation Appiled Physics |
Date Deposited: | 16 Sep 2010 06:50 |
Last Modified: | 19 Sep 2010 06:15 |
URI: | http://eprints.iisc.ac.in/id/eprint/31798 |
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