Nanomechanical Characterization of Indium Nano/Microwires

Kumar, Prashant and Kiran, MSRN (2010) Nanomechanical Characterization of Indium Nano/Microwires. In: Nanoscale Res Lett, 5 (7). pp. 1085-1092.

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Abstract

Nanomechanical properties of indium nanowires like structures fabricated on quartz substrate by trench template technique, measured using nanoindentation. The hardness and elastic modulus of wires were measured and compared with the values of indium thin film. Displacementburst observed while indenting the nanowire. `Wire-only hardness' obtained using Korsunsky model from composite hardness. Nanowires have exhibited almost same modulus as indium thin film but considerable changes were observed in hardness value.

Item Type:	Journal Article
Publication:	Nanoscale Res Lett
Publisher:	Springer
Additional Information:	Copyright of this article belongs to Springer.
Keywords:	Trench template method;Nanowires;Nanomechanical property.
Department/Centre:	Division of Mechanical Sciences > Materials Engineering (formerly Metallurgy)
Date Deposited:	09 Aug 2010 06:54
Last Modified:	19 Sep 2010 06:13
URI:	http://eprints.iisc.ac.in/id/eprint/31031

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