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Influence of surfactant and annealing temperature on optical properties of sol-gel derived nano-crystalline TiO2 thin films

Vishwas, M and Sharma, Sudhir Kumar and Rao, K Narasimha and Mohan, S and Gowda, KV Arjuna and Chakradhar, RPS (2010) Influence of surfactant and annealing temperature on optical properties of sol-gel derived nano-crystalline TiO2 thin films. In: Spectrochimica Acta Part A: Molecular and Biomolecular Spectroscopy, 75 (3). pp. 1073-1077.

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Official URL: http://dx.doi.org/10.1016/j.saa.2009.12.057

Abstract

Titanium dioxide thin films have been synthesized by sol-gel spin coating technique on glass and silicon substrates with and without surfactant polyethylene glycol (PEG). XRD and SEM results confirm the presence of nano-crystalline (anatase) phase at an annealing temperature of 300 degrees C. The influence of surfactant and annealing temperature on optical properties of TiO2 thin films has been studied. Optical constants and film thickness were estimated by Swanepoel's (envelope) method and by ellipsometric measurements in the visible spectral range. The optical transmittance and reflectance were found to decrease with an increase in PEG percentage. Refractive index of the films decreased and film thickness increased with the increase in percentage of surfactant. The refractive index of the un-doped TiO2 films was estimated at different annealing temperatures and it has increased with the increasing annealing temperature. The optical band gap of pure TiO2 films was estimated by Tauc's method at different annealing temperature. (C) 2010 Elsevier B.V. All rights reserved.

Item Type: Journal Article
Publication: Spectrochimica Acta Part A: Molecular and Biomolecular Spectroscopy
Publisher: Elsevier Science.
Additional Information: Copyright of this article belongs to Elsevier Science.
Keywords: TiO2 thin films; Sol-gel process; Optical properties; XRD; SEM; PEG
Department/Centre: Division of Physical & Mathematical Sciences > Instrumentation Appiled Physics
Date Deposited: 07 Jun 2010 06:31
Last Modified: 19 Sep 2010 05:58
URI: http://eprints.iisc.ac.in/id/eprint/26630

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