Bhattacharyya, S and Laha, Apurba and Krupanidhi, SB (2002) Impact of Sr content on dielectric and electrical properties of pulsed laser ablated SrBi2Ta2O9 thin films. In: Journal of Applied Physics, 92 (2). pp. 1056-1061.
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Abstract
The ferroelectric properties of SrBi2Ta2O9 thin films grown by laser ablation were investigated as a function of the Sr+2 content in the films. Different target compositions were used to obtain films with different Sr+2/Ta+5 ratios. The initial composition was according to the stoichiometric composition (1/2), and the Sr+2/Ta+5 ratio was varied to 0.7/2.0. It was seen that the remanent polarization showed a consistent increase, as the film became more deficient of "Sr+2" up to a certain extent. Similarly, a decrease in the dielectric constant and the leakage current with the decrease of Sr+2 in the film was observed. The dielectric transition temperature showed an increase with the reduction of Sr+2 content and was seen to approach the bulk value.
Item Type: | Journal Article |
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Publication: | Journal of Applied Physics |
Publisher: | American Institute of Physics |
Additional Information: | Copyright for this article belongs to American Institute of Physics (AIP). |
Department/Centre: | Division of Chemical Sciences > Materials Research Centre |
Date Deposited: | 31 Dec 2004 |
Last Modified: | 19 Sep 2010 04:17 |
URI: | http://eprints.iisc.ac.in/id/eprint/2544 |
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