Chang, CL and Shukla, SP and Pan, W and Venkataraman, V and Sturm, JC and Shayegan, M (1998) Effective mass measurement in two-dimensional hole gas in strained $Si_{1-x-y}Ge_xC_y/ Si$(100) modulation doped heterostructures. In: Thin Solid Films, 321 (1-2). pp. 51-54.
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Abstract
A two-dimensional hole gas in the Si1-x-yGexCy channel on a Si(100) substrate has been demonstrated at temperatures from 0.3 to 300 K. The hole mobility decreases as more C is added. The hole effective mass has also been measured based on the analysis of the temperature dependence of Shubnikov-de Haas oscillations. It is found that the addition of C, up to 0.6%, does nor change the effective mass of holes in Si1-xGex. It suggests that the valence band structure of Si1-x-yGexCy is similar to that of Si1-xGex.
Item Type: | Journal Article |
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Publication: | Thin Solid Films |
Publisher: | Elsevier Science |
Additional Information: | Copyright of this article belongs to Elsevier Science. |
Keywords: | mass measurement; 2D hole gas; Si(100). |
Department/Centre: | Division of Physical & Mathematical Sciences > Physics |
Date Deposited: | 02 Jun 2009 10:35 |
Last Modified: | 19 Sep 2010 05:01 |
URI: | http://eprints.iisc.ac.in/id/eprint/18434 |
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