Bhattacharyya, S and Krupanidhi, SB (2001) Study of layered structured ferroelectric materials grown by laser ablation. In: Ferroelectrics, 260 . pp. 161-167.
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Layered structured ferroelectric thin films of different compounds were deposited by an excimer laser ablation process. $SrBi_2Nb_2O_9$ was here chosen as the initial compound. The remnant and spontaneous polarization in a pure $SrBi_2Nb_2O_9$ thin film was found to be 6 $\mu C/cm^2$ and 15 $\mu C/cm^2$ respectively. The dielectric constant was 220 at 100 kHz. In the films, the usual 'B' site cation, '$Nb^ {+2}$' replaced '$Ta^{+2}$' partially. Different parameters were chosen during deposition, which in turn controlled the $Sr^{+2}/Ta^{+5}$ ratio. It was seen that the extent of crystallinity and the microstructure depends upon the amount of '$Sr^{+2}$', present in the compound. The dielectric and the conduction properties were studied as a function of the cation $(Ta^{+2}/Nb^{+2})$ ratio in the 'B' site, to study the coupling phenomenon.
| Item Type: | Journal Article |
|---|---|
| Publication: | Ferroelectrics |
| Publisher: | Taylor and Francis |
| Additional Information: | Copyright of this article belongs to Taylor and Francis |
| Keywords: | PLD;SBN;Ferroeletrics |
| Department/Centre: | Division of Chemical Sciences > Materials Research Centre |
| Date Deposited: | 09 Aug 2007 |
| Last Modified: | 27 Aug 2008 12:44 |
| URI: | http://eprints.iisc.ac.in/id/eprint/10463 |
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