Sindia, Suraj and Singh, Virendra and Agrawal , Vishwani (2009) V-Transform: “An Enhanced Polynomial Coefficient Based DC Test for Non-linear Analog Circuits. In: IEEE East West Design and Test Symposium (EWDTS) 2009, Sep 2009, Moscow, Russia.
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Abstract
Abstract—DC testing of parametric faults in non-linear analog circuits based on a new transformation, entitled, V-Transform acting on polynomial coefficient expansion of the circuit function is presented. V-Transform serves the dual purpose of monotonizing polynomial coefficients of circuit function expansion and increasing the sensitivity of these coefficients to circuit parameters. The sensitivity of V-Transform Coefficients (VTC) to circuit parameters is up to 3x-5x more than sensitivity of polynomial coefficients. As a case study, we consider a benchmark elliptic filter to validate our method. The technique is shown to uncover hitherto untestable parametric faults whose sizes are smaller than 10 % of the nominal values. I.
Item Type: | Conference Paper |
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Department/Centre: | Division of Interdisciplinary Sciences > Supercomputer Education & Research Centre |
Date Deposited: | 14 Dec 2011 05:09 |
Last Modified: | 14 Dec 2011 05:16 |
URI: | http://eprints.iisc.ac.in/id/eprint/41270 |
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